PRACTICAL SURFACE-ANALYSIS - STATE-OF-THE-ART AND RECENT DEVELOPMENTS IN AES, XPS, ISS AND SIMS

被引：88

作者：

HOFMANN, S

机构：

[1] Max-Planck-Inst fuer Metallforschung, Stuttgart, West Ger, Max-Planck-Inst fuer Metallforschung, Stuttgart, West Ger

来源：

SURFACE AND INTERFACE ANALYSIS | 1986年 / 9卷 / 1-6期

关键词：

D O I：

10.1002/sia.740090104

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

141

引用

页码：3 / 20

页数：18

共 141 条

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[5] BAUER HE, 1980, 7TH P EL MICR EUR C, V3, P214
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[J]. SURFACE AND INTERFACE ANALYSIS, 1981, 3 (06) : 243 - 250
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[8] PHOTOELECTRON SPECTROMICROSCOPY
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 451 - 460

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