ELEMENTAL MAPPING WITH THE KARLSRUHE NUCLEAR MICRO-PROBE

被引:17
作者
HECK, D
机构
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 197卷 / 01期
关键词
D O I
10.1016/0167-5087(82)90122-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:91 / 96
页数:6
相关论文
共 16 条
[1]  
BIRD JR, 1974, ATOM ENERGY REV, V12, P275
[2]   PIXE MICRO-PROBE ANALYSIS WITH THE HEIDELBERG PROTON MICRO-PROBE [J].
CHEN, JR ;
KNEIS, H ;
MARTIN, B ;
NOBILING, R ;
PELTE, D ;
POVH, B ;
TRAXEL, K .
NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3) :141-148
[3]   THE USE OF THE PIXE TECHNIQUE WITH NUCLEAR MICROPROBES [J].
COOKSON, JA .
NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3) :115-124
[4]   PRODUCTION AND USE OF A NUCLEAR MICROPROBE OF IONS AT MEV ENERGIES [J].
COOKSON, JA .
NUCLEAR INSTRUMENTS & METHODS, 1979, 165 (03) :477-508
[5]   THE INFLUENCE OF SECONDARY FLUORESCENCE FROM ELEMENTS ADJACENT TO THE MICROBEAM SPOT ON LOCAL CONCENTRATION DETERMINATION WITH PIXE [J].
HECK, D .
NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3) :135-139
[6]  
HECK D, 1979, BEITR ELEKTRONENMIKR, V12, P259
[7]  
HECK D, 1976, REPORT KFK, V2379, P108
[8]  
HECK D, 1978, KFK2734 REP
[9]   EXCITATION-FUNCTION OF REACTION C-12(D,P(O))C-13 BETWEEN 400 AND 1350 KEV - ANGULAR-DISTRIBUTIONS [J].
HUEZ, M ;
WEBER, G ;
QUAGLIA, L .
NUCLEAR INSTRUMENTS & METHODS, 1972, 105 (02) :197-&
[10]   ANALYTICAL APPLICATION OF PARTICLE INDUCED X-RAY-EMISSION [J].
JOHANSSON, SAE ;
JOHANSSON, TB .
NUCLEAR INSTRUMENTS & METHODS, 1976, 137 (03) :473-516