A METHOD FOR IMPROVING THE DEPTH SELECTIVITY OF CONVERSION-ELECTRON MOSSBAUER-SPECTROSCOPY

被引：3

作者：

CHUMAKOV, AI

SMIRNOV, GV

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1987年 / 28卷 / 02期

关键词：

D O I：

10.1016/0168-583X(87)90122-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：307 / 310

页数：4

共 11 条

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[7] DEPTH-SELECTIVE FE-57 CONVERSION-ELECTRON MOSSBAUER-SPECTROSCOPY .2. EXPERIMENTAL TEST - ANGULAR EFFECTS, ACCURACY [J].

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[8] APPLICATION OF X-RAY PHOTOELECTRON ENERGY ANALYSIS TO DEPTH-SELECTIVE STUDIES OF THE SUBSURFACE-LAYER STRUCTURE [J].

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[9] DEPTH-SELECTIVE CONVERSION-ELECTRON MOSSBAUER-SPECTROSCOPY [J].

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