A STUDY OF SINGLE EVENTS IN GAAS SRAMS

被引：10

作者：

WEATHERFORD, TR

HAUSER, JR

DIEHLNAGLE, SE

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1985年 / 32卷 / 06期

关键词：

D O I：

10.1109/TNS.1985.4334088

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4170 / 4175

页数：6

共 15 条

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[9] SUGGESTED SINGLE EVENT UPSET FIGURE OF MERIT [J].

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[10]

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