SURFACE IMAGING IN AIR WITH A FORCE MICROSCOPE

被引：5

作者：

ISHIZAKA, T

MORITA, S

SUGAWARA, Y

OKADA, T

MISHIMA, S

IMAI, S

MIKOSHIBA, N

机构：

[1] IWATE UNIV,FAC ENGN,DEPT ELECT ENGN,MORIOKA,IWATE 020,JAPAN

[2] OLYMPUS OPT CO LTD,HACHIOJI 192,JAPAN

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期

关键词：

D O I：

10.1116/1.576404

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：391 / 393

页数：3

共 5 条

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QUATE, CF .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :271-274

[2] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

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[3] ATOMIC FORCE MICROSCOPY USING OPTICAL INTERFEROMETRY [J].

ERLANDSSON, R ;

MCCLELLAND, GM ;

MATE, CM ;

CHIANG, S .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :266-270

[4] ATOMIC FORCE MICROSCOPY - GENERAL-ASPECTS AND APPLICATION TO INSULATORS [J].

HEINZELMANN, H ;

MEYER, E ;

GRUTTER, P ;

HIDBER, HR ;

ROSENTHALER, L ;

GUNTHERODT, HJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :275-278

[5] ATOMIC RESOLUTION ATOMIC FORCE MICROSCOPY OF GRAPHITE AND THE NATIVE OXIDE ON SILICON [J].

MARTI, O ;

DRAKE, B ;

GOULD, S ;

HANSMA, PK .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :287-290

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