STRUCTURAL CHARACTERIZATION OF TIN SELENIDE THIN-FILMS

被引：30

作者：

RAO, TS

SAMANTHARAY, BK

CHAUDHURI, AK

机构：

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 1985年 / 4卷 / 06期

关键词：

D O I：

10.1007/BF00726977

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：743 / 745

页数：3

共 9 条

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[5]

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[6] X-RAY STUDIES ON THE MICROSTRUCTURE OF VACUUM EVAPORATED SNTE THIN-FILMS [J].

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[7] STUDY OF PHOTOCONDUCTIVE PBTE FILMS BY METHOD OF VARIANCE ANALYSIS OF X-RAY-DIFFRACTION PROFILES [J].

SINHA, NLP ;

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BOSE, HN .

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[8] A NUMERICAL FOURIER-ANALYSIS METHOD FOR THE CORRECTION OF WIDTHS AND SHAPES OF LINES ON X-RAY POWDER PHOTOGRAPHS [J].

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