AN EXPERIMENTALLY VERIFIED IGBT MODEL IMPLEMENTED IN THE SABER CIRCUIT SIMULATOR

被引：183

作者：

HEFNER, AR ^{[1
]}

DIEBOLT, DM ^{[1
]}

机构：

[1] ANAL INC,BEAVERTON,OR 97075

来源：

IEEE TRANSACTIONS ON POWER ELECTRONICS | 1994年 / 9卷 / 05期

关键词：

Insulated gate bipolar transistors - Saber circuit simulator;

D O I：

10.1109/63.321038

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A physics-based IGBT model is implemented into the general purpose circuit simulator Saber(TM). The IGBT model includes all of the physical effects that have been shown to be important for describing IGBT's, and the model is valid for general external circuit conditions. The Saber IGBT model is evaluated for the range of static and dynamic conditions in which the device is intended to be operated, and the simulations compare well with experimental results for all of the conditions studied.

引用

页码：532 / 542

页数：11

共 13 条

[1]

BALIGA BJ, 1987, MODERN POWER DEVICES, P55

[2]

DIVEKAR DA, 1988, FET MODELING CIRCUIT, P70

[3]

GRANT DA, 1989, POWER MOSFETS THEORY, P64

[4]

Hefner A. R. Jr., 1988, Conference Record of the 1988 Industry Applications Society Annual Meeting (IEEE Cat. No.88CH2565-0), P606, DOI 10.1109/IAS.1988.25124

[5] An Investigation of the Drive Circuit Requirements for the Power Insulated Gate Bipolar Transistor (IGBT) [J].

Hefner, Allen R., Jr. .

IEEE TRANSACTIONS ON POWER ELECTRONICS, 1991, 6 (02) :208-219

[6] An Improved Understanding for the Transient Operation of the Power Insulated Gate Bipolar Transistor (IGBT) [J].

Hefner, Allen R., Jr. .

IEEE TRANSACTIONS ON POWER ELECTRONICS, 1990, 5 (04) :459-468

[7] ANALYTICAL MODELING OF DEVICE CIRCUIT INTERACTIONS FOR THE POWER INSULATED GATE BIPOLAR-TRANSISTOR (IGBT) [J].

HEFNER, AR .

IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 1990, 26 (06) :995-1005

[8] AN ANALYTICAL MODEL FOR THE STEADY-STATE AND TRANSIENT CHARACTERISTICS OF THE POWER INSULATED-GATE BIPOLAR-TRANSISTOR [J].

HEFNER, AR ;

BLACKBURN, DL .

SOLID-STATE ELECTRONICS, 1988, 31 (10) :1513-1532

[9]

HEFNER AR, 1992, NIST40088 SPEC PUBL

[10]

HEFNER AR, 1990, 2ND REC IEEE WORKSH, P233

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