OPTIMAL INTERCONNECTION CIRCUITS FOR VLSI

[1] BAKOGLU HB, 1984, FEB ISSCC, P164

[2] MICROELECTRONIC PACKAGING [J]. SCIENTIFIC AMERICAN, 1983, 249 (01) : 86 - &

[3] SPECIFIC CONTACT RESISTANCE OF METAL-SEMICONDUCTOR BARRIERS [J]. SOLID-STATE ELECTRONICS, 1971, 14 (07) : 541 - &

[4] ANALYTICAL IC METAL-LINE CAPACITANCE FORMULAS [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1976, 24 (09) : 608 - 611

[5] Dang R. L. M., 1981, IEEE Electron Device Letters, VEDL-2, P196, DOI 10.1109/EDL.1981.25399

[6] DESIGN OF ION-IMPLANTED MOSFETS WITH VERY SMALL PHYSICAL DIMENSIONS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (05) : 256 - 268

[7] THE WIRE-LIMITED LOGIC CHIP [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1982, 17 (06) : 1232 - 1233

[8] EVOLUTION OF DIGITAL ELECTRONICS TOWARDS VLSI [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (04) : 271 - 279

[9] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J]. PHYSICAL REVIEW B, 1970, 1 (04): : 1382 - &

[10] MINIMUM PROPAGATION DELAYS IN VLSI [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1982, 17 (04) : 773 - 775

[1] BAKOGLU HB, 1984, FEB ISSCC, P164

[2] MICROELECTRONIC PACKAGING [J]. SCIENTIFIC AMERICAN, 1983, 249 (01) : 86 - &

[3] SPECIFIC CONTACT RESISTANCE OF METAL-SEMICONDUCTOR BARRIERS [J]. SOLID-STATE ELECTRONICS, 1971, 14 (07) : 541 - &

[4] ANALYTICAL IC METAL-LINE CAPACITANCE FORMULAS [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1976, 24 (09) : 608 - 611

[5] Dang R. L. M., 1981, IEEE Electron Device Letters, VEDL-2, P196, DOI 10.1109/EDL.1981.25399

[6] DESIGN OF ION-IMPLANTED MOSFETS WITH VERY SMALL PHYSICAL DIMENSIONS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (05) : 256 - 268

[7] THE WIRE-LIMITED LOGIC CHIP [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1982, 17 (06) : 1232 - 1233

[8] EVOLUTION OF DIGITAL ELECTRONICS TOWARDS VLSI [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (04) : 271 - 279

[9] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J]. PHYSICAL REVIEW B, 1970, 1 (04): : 1382 - &

[10] MINIMUM PROPAGATION DELAYS IN VLSI [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1982, 17 (04) : 773 - 775