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DIODE CHARACTERISTICS IN LASER-RECRYSTALLIZED AND CONVENTIONAL POLYCRYSTALLINE SILICON
被引:8
作者
:
EGGERMONT, GEJ
论文数:
0
引用数:
0
h-index:
0
EGGERMONT, GEJ
DEGROOT, JG
论文数:
0
引用数:
0
h-index:
0
DEGROOT, JG
机构
:
来源
:
ELECTRON DEVICE LETTERS
|
1982年
/ 3卷
/ 06期
关键词
:
D O I
:
10.1109/EDL.1982.25520
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:156 / 158
页数:3
相关论文
共 6 条
[1]
GRAIN-BOUNDARY STATES AND THE CHARACTERISTICS OF LATERAL POLYSILICON DIODES
DEGRAAFF, HC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
DEGRAAFF, HC
HUYBERS, M
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
HUYBERS, M
DEGROOT, JG
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
DEGROOT, JG
[J].
SOLID-STATE ELECTRONICS,
1982,
25
(01)
: 67
-
71
[2]
DEGRAAFF HC, UNPUB
[3]
EGGERMONT GEJ, UNPUB
[4]
GRAIN-BOUNDARIES IN P-N-JUNCTION DIODES FABRICATED IN LASER-RECRYSTALLIZED SILICON THIN-FILMS
JOHNSON, NM
论文数:
0
引用数:
0
h-index:
0
JOHNSON, NM
BIEGELSEN, DK
论文数:
0
引用数:
0
h-index:
0
BIEGELSEN, DK
MOYER, MD
论文数:
0
引用数:
0
h-index:
0
MOYER, MD
[J].
APPLIED PHYSICS LETTERS,
1981,
38
(11)
: 900
-
902
[5]
LEE KF, 1980, LASER ELECTRON BEAM, P632
[6]
ELECTRICAL-PROPERTIES OF CW LASER-ANNEALED ION-IMPLANTED POLYCRYSTALLINE SILICON
ROULET, ME
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
ROULET, ME
DUTOIT, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
DUTOIT, M
LUTHY, W
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
LUTHY, W
AFFOLTER, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
AFFOLTER, K
[J].
APPLIED PHYSICS LETTERS,
1980,
37
(08)
: 737
-
739
←
1
→
共 6 条
[1]
GRAIN-BOUNDARY STATES AND THE CHARACTERISTICS OF LATERAL POLYSILICON DIODES
DEGRAAFF, HC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
DEGRAAFF, HC
HUYBERS, M
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
HUYBERS, M
DEGROOT, JG
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
PHILIPS RES LABS, SUNNYVALE, CA 94086 USA
DEGROOT, JG
[J].
SOLID-STATE ELECTRONICS,
1982,
25
(01)
: 67
-
71
[2]
DEGRAAFF HC, UNPUB
[3]
EGGERMONT GEJ, UNPUB
[4]
GRAIN-BOUNDARIES IN P-N-JUNCTION DIODES FABRICATED IN LASER-RECRYSTALLIZED SILICON THIN-FILMS
JOHNSON, NM
论文数:
0
引用数:
0
h-index:
0
JOHNSON, NM
BIEGELSEN, DK
论文数:
0
引用数:
0
h-index:
0
BIEGELSEN, DK
MOYER, MD
论文数:
0
引用数:
0
h-index:
0
MOYER, MD
[J].
APPLIED PHYSICS LETTERS,
1981,
38
(11)
: 900
-
902
[5]
LEE KF, 1980, LASER ELECTRON BEAM, P632
[6]
ELECTRICAL-PROPERTIES OF CW LASER-ANNEALED ION-IMPLANTED POLYCRYSTALLINE SILICON
ROULET, ME
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
ROULET, ME
DUTOIT, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
DUTOIT, M
LUTHY, W
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
LUTHY, W
AFFOLTER, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
AFFOLTER, K
[J].
APPLIED PHYSICS LETTERS,
1980,
37
(08)
: 737
-
739
←
1
→