TOMOGRAPHIC IMAGING OF MICROMETER-SIZED OPTICAL AND SOFT-X-RAY BEAMS

被引：7

作者：

HERTZ, HM ^{[1
]}

BYER, RL ^{[1
]}

机构：

[1] STANFORD UNIV,EDWARD L GINZTON LAB,STANFORD,CA 94305

来源：

OPTICS LETTERS | 1990年 / 15卷 / 07期

关键词：

D O I：

10.1364/OL.15.000396

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The knife-edge technique for measurements of micrometer-sized beams is extended to two-dimensional imaging by tomographic reconstruction of multiangular knife-edge data. Two-dimensional intensity distributions at optical (633-nm) and soft-x-ray (13.5-nm) wavelengths at the focal region of a Schwarzschild objective are presented. The resolution is limited by the 200-nm step size used in the data acquisition. © 1990 Optical Society of America.

引用

页码：396 / 398

页数：3

共 21 条

[1] FAN-BEAM-TOMOGRAPHY NOISE THEORY
BENNETT, KE
BYER, RL
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1986, 3 (05): : 624 - 633
[2] MEASUREMENT OF 1-MU-M DIAM BEAMS
CANNON, B
GARDNER, TS
COHEN, DK
[J]. APPLIED OPTICS, 1986, 25 (17): : 2981 - 2983
[3] TUNABLE DIFFERENTIAL INTERFEROMETER FOR OPTICAL TOMOGRAPHY
FARIS, GW
HERTZ, HM
[J]. APPLIED OPTICS, 1989, 28 (21): : 4662 - 4667
[4] QUANTITATIVE 3-DIMENSIONAL OPTICAL TOMOGRAPHIC IMAGING OF SUPERSONIC FLOWS
FARIS, GW
BYER, RL
[J]. SCIENCE, 1987, 238 (4834) : 1700 - 1702
[5] FARIS GW, 1986, THESIS STANFORD U ST
[6] KNIFE-EDGE SCANNING MEASUREMENTS OF SUBWAVELENGTH FOCUSED LIGHT-BEAMS
FIRESTER, AH
HELLER, ME
SHENG, P
[J]. APPLIED OPTICS, 1977, 16 (07) : 1971 - 1974
[7] 3-DIMENSIONAL X-RAY MICROTOMOGRAPHY
FLANNERY, BP
DECKMAN, HW
ROBERGE, WG
DAMICO, KL
[J]. SCIENCE, 1987, 237 (4821) : 1439 - 1444
[8] THE SPECIAL ISSUE ON COMPUTERIZED-TOMOGRAPHY
HERMAN, GT
[J]. PROCEEDINGS OF THE IEEE, 1983, 71 (03) : 291 - 292
[9] EXPERIMENTAL-DETERMINATION OF 2-D FLAME TEMPERATURE-FIELDS BY INTERFEROMETRIC TOMOGRAPHY
HERTZ, HM
[J]. OPTICS COMMUNICATIONS, 1985, 54 (03) : 131 - 136
[10] KERR EFFECT TOMOGRAPHY FOR NONINTRUSIVE SPATIALLY RESOLVED MEASUREMENTS OF ASYMMETRIC ELECTRIC-FIELD DISTRIBUTIONS
HERTZ, HM
[J]. APPLIED OPTICS, 1986, 25 (06): : 914 - 921

← 1 2 3 →