SCANNING NEAR-FIELD OPTIC ATOMIC-FORCE MICROSCOPY

被引：48

作者：

MURAMATSU, H ^{[1
]}

CHIBA, N ^{[1
]}

ATAKA, T ^{[1
]}

MONOBE, H ^{[1
]}

FUJIHIRA, M ^{[1
]}

机构：

[1] TOKYO INST TECHNOL,DEPT BIOMOLEC ENGN,MIDORI KU,YOKOHAMA,KANAGAWA 227,JAPAN

来源：

ULTRAMICROSCOPY | 1995年 / 57卷 / 2-3期

关键词：

D O I：

10.1016/0304-3991(94)00125-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Design and performance of a scanning near-field optic/atomic-force microscope (SNOAM) is described in this paper. A sharpened and bent optical fiber was used as a near-field optical probe as well as an atomicforce microscope probe in vertical vibrating mode. The SNOAM provided simultaneous topographical and optical imagings in several optical setting modes. Sub-micron levels of chromium patterns on a glass substrate were clearly observed by the SNOAM.

引用

页码：141 / 146

页数：6

共 18 条

[1] NEAR-FIELD OPTICS - MICROSCOPY, SPECTROSCOPY, AND SURFACE MODIFICATION BEYOND THE DIFFRACTION LIMIT [J].