APPLICATION OF X-RAY PHOTOELECTRON-SPECTROSCOPY TO QUANTITATIVE-ANALYSIS WITHOUT STANDARDS

被引：16

作者：

HIROKAWA, K ^{[1
]}

OKU, M ^{[1
]}

机构：

[1] TOHOKU UNIV,GEOL RES INST,SENDAI,MIYAGI 980,JAPAN

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1977年 / 285卷 / 3-4期

关键词：

D O I：

10.1007/BF00453564

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：192 / 198

页数：7

共 38 条

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[7] X-RAY PHOTOELECTRON MICROANALYSIS AND MICROSCOPY - PRINCIPLE AND EXPECTED PERFORMANCES
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[8] Ebel H., 1973, Journal of Electron Spectroscopy and Related Phenomena, V2, P277, DOI 10.1016/0368-2048(73)80020-9
[9] QUANTITATIVE-ANALYSIS OF BINARY-ALLOYS BY XPS
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[10] ATTENUATION LENGTH FOR PHOTOELECTRONS EXCITED IN ALUMINUM BY 21.2-EV PHOTONS
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