BEHAVIOR OF HGI2 NUCLEAR DETECTORS IRRADIATED WITH HIGH X-RAY FLUENCES

被引：10

作者：

SCHIEBER, M

BEINGLASS, I

HOLZER, A

DISHON, G

机构：

[1] HEBREW UNIV JERUSALEM,SCH APPL SCI,JERUSALEM 91000,ISRAEL

[2] HADASSAH UNIV HOSP & MED SCH,E LOEWENTHAL INST RADIUM,JERUSALEM,ISRAEL

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1977年 / 24卷 / 01期

关键词：

D O I：

10.1109/TNS.1977.4328658

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：148 / 153

页数：6

共 16 条

[11]

SCHOLZ H, 1974, ACTA ELECTRONICS, V17, P69

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SCHIEBER, MM ;

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[13] RECENT ADVANCES WITH HGI2 X-RAY DETECTORS [J].

SWIERKOW.SP ;

ARMANTRO.GA ;

WICHNER, R .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1974, NS21 (01) :302-304

[14] PROGNOSIS FOR HIGH-Z-SEMICONDUCTOR DETECTORS [J].

SWIERKOWSKI, SP ;

ARMANTROUT, GA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, NS22 (01) :205-210

[15] HIGH-RESOLUTION HGL2 X-RAY SPECTROMETERS [J].

SWIERKOWSKI, SP ;

ARMANTROUT, GA ;

WICHNER, R .

APPLIED PHYSICS LETTERS, 1973, 23 (05) :281-282

[16] MERCURY IODIDE AS A GAMMA SPECTROMETER [J].

WILLIG, WR .

NUCLEAR INSTRUMENTS & METHODS, 1971, 96 (04) :615-&

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