QUANTITATIVE ELECTRON-DIFFRACTION - NEW FEATURES IN THE PROGRAM SYSTEM ELD

Accurate quantitative intensities from electron diffraction patterns can be obtained by the program system ELD. Such data is needed for solving or refining crystal structures. ELD runs on a personal computer. The quality of normal (i.e. not slow-scan) CCD cameras is sufficient for giving quite accurate structure factor amplitudes from electron diffraction patterns. Several factors which affect the intensity evaluation are discussed and some algorithms in ELD concerned with the problems of extracting high quality quantitative structure factors from electron diffraction patterns are described.