FAST ATOM BOMBARDMENT MASS-SPECTROMETRY FOR APPLIED SURFACE-ANALYSIS

[11] USE OF AN ELECTRON FLOOD GUN TO REDUCE SURFACE CHARGING IN X-RAY PHOTOELECTRON SPECTROSCOPY [J]. APPLIED PHYSICS LETTERS, 1972, 20 (04) : 158 - &

[12] KNOZINGER H, 1980, 7TH P INT C CAT TOK

[13] TEST OF A QUANTITATIVE APPROACH TO SECONDARY ION MASS-SPECTROMETRY ON GLASS AND SILICATE STANDARDS [J]. ANALYTICAL CHEMISTRY, 1977, 49 (07) : 927 - 931

[14] READ SJB, 1975, ELECTRON PROBE MICRO

[15] FAST ATOM BOMBARDMENT QUADRUPOLE MASS-SPECTROMETRY [J]. JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS, 1981, (07) : 324 - 325

[16] SURMAN DJ, APPL SURF SCI

[17] VANDENBERG J, UNPUB

[18] WINOGRAD N, 1979, SIMS, V2

[19] USE OF SECONDARY ION MASS-SPECTROMETRY FOR STUDIES OF OXYGEN-ADSORPTION AND OXIDATION [J]. SURFACE SCIENCE, 1977, 68 (01) : 118 - 129

[20] WITTMAACK K, 1977, 7TH P INT VAC C 3RD, P2573

[11] USE OF AN ELECTRON FLOOD GUN TO REDUCE SURFACE CHARGING IN X-RAY PHOTOELECTRON SPECTROSCOPY [J]. APPLIED PHYSICS LETTERS, 1972, 20 (04) : 158 - &

[12] KNOZINGER H, 1980, 7TH P INT C CAT TOK

[13] TEST OF A QUANTITATIVE APPROACH TO SECONDARY ION MASS-SPECTROMETRY ON GLASS AND SILICATE STANDARDS [J]. ANALYTICAL CHEMISTRY, 1977, 49 (07) : 927 - 931

[14] READ SJB, 1975, ELECTRON PROBE MICRO

[15] FAST ATOM BOMBARDMENT QUADRUPOLE MASS-SPECTROMETRY [J]. JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS, 1981, (07) : 324 - 325

[16] SURMAN DJ, APPL SURF SCI

[17] VANDENBERG J, UNPUB

[18] WINOGRAD N, 1979, SIMS, V2

[19] USE OF SECONDARY ION MASS-SPECTROMETRY FOR STUDIES OF OXYGEN-ADSORPTION AND OXIDATION [J]. SURFACE SCIENCE, 1977, 68 (01) : 118 - 129

[20] WITTMAACK K, 1977, 7TH P INT VAC C 3RD, P2573