USE OF SECONDARY ION MASS-SPECTROMETRY FOR STUDIES OF OXYGEN-ADSORPTION AND OXIDATION

被引：50

作者：

WITTMAACK, K ^{[1
]}

机构：

[1] GESELL STRAHLEN & UMWELTFORSCH MBH,PHYS TECH ABT,D-8042 NEUHERBERG,FED REP GER

来源：

SURFACE SCIENCE | 1977年 / 68卷 / 01期

关键词：

D O I：

10.1016/0039-6028(77)90196-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：118 / 129

页数：12

共 42 条

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[9] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .2. OXIDATION OF CHROMIUM IN MONOLAYER RANGE
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[10] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS)
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[J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

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