USE OF SECONDARY ION MASS-SPECTROMETRY FOR STUDIES OF OXYGEN-ADSORPTION AND OXIDATION

[21] SOME ASPECTS OF SURFACE BEHAVIOR OF SILICON [J]. SURFACE SCIENCE, 1973, 35 (01) : 1 - 7

[22] Kelly R., 1973, Radiation Effects, V19, P39, DOI 10.1080/00337577308232213

[23] SECONDARY ION EMISSION FROM SILICON AND SILICON-OXIDE [J]. SURFACE SCIENCE, 1975, 47 (01) : 358 - 369

[24] ION-BEAM SPUTTERING - EFFECT OF INCIDENT ION ENERGY ON ATOMIC MIXING IN SUBSURFACE LAYERS [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1974, 21 (04): : 209 - 215

[25] ABUNDANCE OF MOLECULAR-IONS IN SECONDARY ION MASS-SPECTROMETRY [J]. APPLIED PHYSICS, 1976, 11 (02): : 193 - 195

[26] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .3. OXIDATION OF VANADIUM, NIOBIUM AND TANTALUM IN MONOLAYER RANGE [J]. SURFACE SCIENCE, 1973, 39 (02) : 427 - 436

[27] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .5. OXIDATION OF TITANIUM, NICKEL, AND COPPER IN MONOLAYER RANGE [J]. SURFACE SCIENCE, 1974, 41 (02) : 493 - 503

[28] Schulz F., 1973, Radiation Effects, V18, P211, DOI 10.1080/00337577308232124

[29] THEORY OF SPUTTERING .I. SPUTTERING YIELD OF AMORPHOUS AND POLYCRYSTALLINE TARGETS [J]. PHYSICAL REVIEW, 1969, 184 (02): : 383 - +

[30] SURFACE OXIDATION STUDIES OF IRON USING STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 21 (02): : 479 - 486

[21] SOME ASPECTS OF SURFACE BEHAVIOR OF SILICON [J]. SURFACE SCIENCE, 1973, 35 (01) : 1 - 7

[22] Kelly R., 1973, Radiation Effects, V19, P39, DOI 10.1080/00337577308232213

[23] SECONDARY ION EMISSION FROM SILICON AND SILICON-OXIDE [J]. SURFACE SCIENCE, 1975, 47 (01) : 358 - 369

[24] ION-BEAM SPUTTERING - EFFECT OF INCIDENT ION ENERGY ON ATOMIC MIXING IN SUBSURFACE LAYERS [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1974, 21 (04): : 209 - 215

[25] ABUNDANCE OF MOLECULAR-IONS IN SECONDARY ION MASS-SPECTROMETRY [J]. APPLIED PHYSICS, 1976, 11 (02): : 193 - 195

[26] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .3. OXIDATION OF VANADIUM, NIOBIUM AND TANTALUM IN MONOLAYER RANGE [J]. SURFACE SCIENCE, 1973, 39 (02) : 427 - 436

[27] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .5. OXIDATION OF TITANIUM, NICKEL, AND COPPER IN MONOLAYER RANGE [J]. SURFACE SCIENCE, 1974, 41 (02) : 493 - 503

[28] Schulz F., 1973, Radiation Effects, V18, P211, DOI 10.1080/00337577308232124

[29] THEORY OF SPUTTERING .I. SPUTTERING YIELD OF AMORPHOUS AND POLYCRYSTALLINE TARGETS [J]. PHYSICAL REVIEW, 1969, 184 (02): : 383 - +

[30] SURFACE OXIDATION STUDIES OF IRON USING STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 21 (02): : 479 - 486