STRUCTURE AND STABILITY OF LANGMUIR-BLODGETT-FILMS INVESTIGATED BY SCANNING FORCE MICROSCOPY

被引：68

作者：

CHI, LF ^{[1
]}

ENG, LM ^{[1
]}

GRAF, K ^{[1
]}

FUCHS, H ^{[1
]}

机构：

[1] BASF AG,POLYMER RES LAB,ZKM T-J543,W-6700 LUDWIGSHAFEN,GERMANY

来源：

LANGMUIR | 1992年 / 8卷 / 09期

关键词：

D O I：

10.1021/la00045a030

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We applied scanning force microscopy (SFM) to investigate the surface morphology of Langmuir-Blodgett (LB) films and their intrinsic defect structures as well as the modifications of these films induced by the image process. The SFM reveals the molecular structures on cadmium arachidate films but not on the free acid films. At higher force loadings, the thin organic films are irreversibly degraded by the SFM force sensor. This process can be used to write patterns into the films and test the local viscoelastic properties.

引用

页码：2255 / 2261

页数：7

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