RADIATION-DAMAGE IN SCIENTIFIC CHARGE-COUPLED-DEVICES

被引：69

作者：

JANESICK, J

ELLIOTT, T

POOL, F

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1989年 / 36卷 / 01期

关键词：

D O I：

10.1109/23.34503

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：572 / 578

页数：7

共 14 条

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[5]

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[6]

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JANESICK JR, 1981, P SOC PHOTO-OPT INST, V290, P165

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[9] COUNTING OF DEEP-LEVEL TRAPS USING A CHARGE-COUPLED DEVICE [J].

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[10]

Mohsen A. M., 1974, IEEE Transactions on Electron Devices, VED-21, P701, DOI 10.1109/T-ED.1974.17997

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