HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF 60-DEGREES DISLOCATIONS IN SI-GAAS

被引:25
作者
GERTHSEN, D
PONCE, FA
ANDERSON, GB
机构
[1] Xerox Palo Alto Research Cent, United States
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1989年 / 59卷 / 05期
关键词
13;
D O I
10.1080/01418618908209836
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1045 / 1058
页数:14
相关论文
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