CHEMICAL BEAM EPITAXY OF INXAS1-XP/INP STRAINED SINGLE AND MULTIQUANTUM-WELL STRUCTURES

被引:7
作者
BENSAOULA, A [1 ]
ROSSIGNOL, V [1 ]
BENSAOULA, AH [1 ]
FREUNDLICH, A [1 ]
机构
[1] LPSES,CNRS,F-06560 VALBONNE,FRANCE
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1993年 / 11卷 / 03期
关键词
D O I
10.1116/1.586763
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High-quality pseudomorphically strained InAsxP1-x/InP superlattices and strained multiquantum wells (SMQW) were grown by chemical beam epitaxy (CBE). The As versus P incorporation ratios in ternary InAsP layers is investigated showing that CBE is perfectly suited for a successful control of As composition in such heterostructures. InAs1-xPx/InAs SMQWs with As composition ranging from 30% to 70% were reproducibly realized. The control of InAsP well thickness and composition on the scale of the monolayer as determined through x-ray diffraction analysis is achieved.
引用
收藏
页码:851 / 853
页数:3
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