AUGER AND PHOTOELECTRON LINE ENERGY RELATIONSHIPS IN ALUMINUM-OXYGEN AND SILICON-OXYGEN COMPOUNDS

被引:783
作者
WAGNER, CD
PASSOJA, DE
HILLERY, HF
KINISKY, TG
SIX, HA
JANSEN, WT
TAYLOR, JA
机构
[1] UNION CARBIDE CORP, TARRYTOWN TECH CTR, TARRYTOWN, NY 10591 USA
[2] PERKIN ELMER CORP, DIV PHYS ELECTR, MT VIEW, CA 94043 USA
[3] PERKIN ELMER CORP, DIV PHYS ELECTR, EDEN PRAIRIE, MN 55344 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1982年 / 21卷 / 04期
关键词
Compendex;
D O I
10.1116/1.571870
中图分类号
O59 [应用物理学];
学科分类号
摘要
ALUMINUM COMPOUNDS
引用
收藏
页码:933 / 944
页数:12
相关论文
共 27 条
[1]   ENERGY CALIBRATION IN ELECTRON-SPECTROSCOPY AND THE RE-DETERMINATION OF SOME REFERENCE ELECTRON-BINDING ENERGIES [J].
BIRD, RJ ;
SWIFT, P .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 21 (03) :227-240
[2]   UTILITY OF BREMSSTRAHLUNG-INDUCED AUGER PEAKS [J].
CASTLE, JE ;
WEST, RH .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 16 (03) :195-197
[3]   BREMSSTRAHLUNG-INDUCED AUGER PEAKS [J].
CASTLE, JE ;
WEST, RH .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 18 (04) :355-358
[4]   X-RAY PHOTOELECTRON-SPECTROSCOPY OF SODIUM-PHOSPHATE GLASSES [J].
GRESCH, R ;
MULLERWARMUTH, W ;
DUTZ, H .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 34 (01) :127-136
[5]   LOCAL ATOMIC AND ELECTRONIC-STRUCTURE OF OXIDE-GAAS AND SIO2-SI INTERFACES USING HIGH-RESOLUTION XPS [J].
GRUNTHANER, FJ ;
GRUNTHANER, PJ ;
VASQUEZ, RP ;
LEWIS, BF ;
MASERJIAN, J ;
MADHUKAR, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05) :1443-1453
[6]   CHEMICAL-SHIFTS OF AUGER-ELECTRON LINES AND ELECTRON-BINDING ENERGIES IN FREE MOLECULES - SILICON-COMPOUNDS [J].
KELFVE, P ;
BLOMSTER, B ;
SIEGBAHN, H ;
SIEGBAHN, K ;
SANHUEZA, E ;
GOSCINSKI, O .
PHYSICA SCRIPTA, 1980, 21 (01) :75-88
[7]   ELECTRON ESCAPE DEPTH IN SILICON [J].
KLASSON, M ;
BERNDTSSON, A ;
HEDMAN, J ;
NILSSON, R ;
NYHOLM, R ;
NORDLING, C .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (06) :427-434
[8]  
KOWALCZYK SP, 1974, PHYS REV B, V9, P38
[9]   CHEMICAL-STATE EFFECTS IN AUGER-ELECTRON SPECTROSCOPY [J].
RYE, RR ;
MADEY, TE ;
HOUSTON, JE ;
HOLLOWAY, PH .
JOURNAL OF CHEMICAL PHYSICS, 1978, 69 (04) :1504-1512
[10]  
Siegbahn K., 1969, ESCA APPL FREE MOL