ELECTRON-DIFFRACTION CONDITIONS FOR SURFACE IMAGING

[1] AN ELECTRON-MICROSCOPIC INVESTIGATION OF THE ELECTROCHEMICAL FACETING OF PLATINUM [J]. SURFACE SCIENCE, 1987, 188 (03) : 350 - 363

[2] THE IMAGE-CONTRAST OF SURFACE STEPS IN REFLECTION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1985, 16 (01) : 59 - 67

[3] HEIDE HG, 1981, ULTRAMICROSCOPY, V6, P115, DOI 10.1016/0304-3991(81)90051-6

[4] THE MAGNETIC ELECTRON MICROSCOPE OBJECTIVE - CONTOUR PHENOMENA AND THE ATTAINMENT OF HIGH RESOLVING POWER [J]. JOURNAL OF APPLIED PHYSICS, 1947, 18 (01) : 48 - 71

[5] HOSLER W, 1986, BER BUNSEN PHYS CHEM, V90, P205

[6] REFLECTION ELECTRON-MICROSCOPY (REM) OF FCC METALS [J]. ULTRAMICROSCOPY, 1983, 11 (04) : 239 - 250

[7] HSU T, UNPUB ULTRAMICROSCOP

[8] KOHRA K, 1962, J PHYS SOC JPN, V17, P82

[9] DIRECT ELECTRON-MICROSCOPIC IMAGING OF SURFACE-TOPOGRAPHY BY DIFFRACTION AND PHASE-CONTRAST [J]. ULTRAMICROSCOPY, 1986, 19 (02) : 135 - 146

[10] CONVERGENT-BEAM REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) OBSERVATIONS FROM AN SI(111) SURFACE [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1986, 42 : 569 - 577

[1] AN ELECTRON-MICROSCOPIC INVESTIGATION OF THE ELECTROCHEMICAL FACETING OF PLATINUM [J]. SURFACE SCIENCE, 1987, 188 (03) : 350 - 363

[2] THE IMAGE-CONTRAST OF SURFACE STEPS IN REFLECTION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1985, 16 (01) : 59 - 67

[3] HEIDE HG, 1981, ULTRAMICROSCOPY, V6, P115, DOI 10.1016/0304-3991(81)90051-6

[4] THE MAGNETIC ELECTRON MICROSCOPE OBJECTIVE - CONTOUR PHENOMENA AND THE ATTAINMENT OF HIGH RESOLVING POWER [J]. JOURNAL OF APPLIED PHYSICS, 1947, 18 (01) : 48 - 71

[5] HOSLER W, 1986, BER BUNSEN PHYS CHEM, V90, P205

[6] REFLECTION ELECTRON-MICROSCOPY (REM) OF FCC METALS [J]. ULTRAMICROSCOPY, 1983, 11 (04) : 239 - 250

[7] HSU T, UNPUB ULTRAMICROSCOP

[8] KOHRA K, 1962, J PHYS SOC JPN, V17, P82

[9] DIRECT ELECTRON-MICROSCOPIC IMAGING OF SURFACE-TOPOGRAPHY BY DIFFRACTION AND PHASE-CONTRAST [J]. ULTRAMICROSCOPY, 1986, 19 (02) : 135 - 146

[10] CONVERGENT-BEAM REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) OBSERVATIONS FROM AN SI(111) SURFACE [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1986, 42 : 569 - 577