FAST SCANNING TUNNELING MICROSCOPE FOR DYNAMIC OBSERVATION

被引：12

作者：

HOSAKA, S

HASEGAWA, T

HOSOKI, S

TAKATA, K

机构：

[1] Hitachi, Ltd., Central Research Laboratory, Kokubunji

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 04期

关键词：

D O I：

10.1063/1.1141189

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.

引用

页码：1342 / 1343

页数：2

共 6 条

[1] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].