ORIGIN OF ANOMALOUS CORRUGATION HEIGHT OF STM IMAGES OF GRAPHITE

被引:10
作者
SUGAWARA, Y
ISHIZAKA, T
MORITA, S
机构
[1] HIROSHIMA UNIV,FAC SCI,DEPT PHYS,HIROSHIMA 730,JAPAN
[2] TOHOKU UNIV,ELECT COMMUN RES INST,SENDAI,MIYAGI 980,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1990年 / 29卷 / 08期
关键词
AFM; AFM/STM; Anomalous corrugation height; Atomic force microscope; Atomic force/scanning tunneling microscope; Atomically resolved image; Graphite surface; Scanning tunneling microscope; STM;
D O I
10.1143/JJAP.29.1533
中图分类号
O59 [应用物理学];
学科分类号
摘要
To clarify the origin of the anomalous corrugation height of STM images of a graphite under a constant current mode, we carefully investigated the variation of the tunneling current and forces between the lever and graphite during lateral scans. In the case of an unoxidized Pt lever, the variations of the sample displacement, the lever deflections and the apparent corrugation height were almost independent of the measuring tunneling current. On the other hand, in the case of a slightly oxidized W lever, the variation of the sample displacement, the lever deflection and the apparent corrugation height increased with increasing tunneling current. We also found a tendency that for the W lever, an apparent corrugation height increases monotonously with the increase of the force variation. We concluded that the anomalous corrugation height of STM images of a graphite surface was enhanced by the oxide layer of the tunneling tip. © 1990 The Japan Society of Applied Physics.
引用
收藏
页码:1533 / 1538
页数:6
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