INSITU RHEED OBSERVATION OF SELECTIVE DIMINUTION AT SI(001)-2 X-1 SUPERLATTICE SPOTS DURING MBE

[1] AIZAKI N, 1985, 1985 EXT ABSTR EL SO, V851, P177

[2] ISHIZAKA A, 1982, P C MOL BEAM EPITAXY, P183

[3] PROBABLE ATOMIC-STRUCTURE OF RECONSTRUCTED SI[001]2X1 SURFACES DETERMINED BY LOW-ENERGY ELECTRON-DIFFRACTION [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (04): : L67 - L72

[4] KUGIMIYA K, 1985, 1985 EXT ABSTR EL SO, V851, P164

[5] LOW-ENERGY ELECTRON DIFFRACTION STUDY OF SILICON SURFACE STRUCTURES [J]. JOURNAL OF CHEMICAL PHYSICS, 1962, 37 (04) : 729 - &

[6] REFLECTION ELECTRON-MICROSCOPE OBSERVATIONS OF DISLOCATIONS AND SURFACE-STRUCTURE PHASE-TRANSITION ON CLEAN (111) SILICON SURFACES [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (06) : L309 - L312

[7] OTA Y, 1983, THIN SOLID FILMS, V106, P3, DOI 10.1016/0040-6090(83)90180-3

[8] SAKAMOTO T, 1985, 32ND SPRING M JAP SO, P744

[9] ADVANCED TECHNIQUES TO DECREASE DEFECT DENSITY IN MOLECULAR-BEAM EPITAXIAL SILICON FILMS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (04): : L227 - L229

[1] AIZAKI N, 1985, 1985 EXT ABSTR EL SO, V851, P177

[2] ISHIZAKA A, 1982, P C MOL BEAM EPITAXY, P183

[3] PROBABLE ATOMIC-STRUCTURE OF RECONSTRUCTED SI[001]2X1 SURFACES DETERMINED BY LOW-ENERGY ELECTRON-DIFFRACTION [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (04): : L67 - L72

[4] KUGIMIYA K, 1985, 1985 EXT ABSTR EL SO, V851, P164

[5] LOW-ENERGY ELECTRON DIFFRACTION STUDY OF SILICON SURFACE STRUCTURES [J]. JOURNAL OF CHEMICAL PHYSICS, 1962, 37 (04) : 729 - &

[6] REFLECTION ELECTRON-MICROSCOPE OBSERVATIONS OF DISLOCATIONS AND SURFACE-STRUCTURE PHASE-TRANSITION ON CLEAN (111) SILICON SURFACES [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (06) : L309 - L312

[7] OTA Y, 1983, THIN SOLID FILMS, V106, P3, DOI 10.1016/0040-6090(83)90180-3

[8] SAKAMOTO T, 1985, 32ND SPRING M JAP SO, P744

[9] ADVANCED TECHNIQUES TO DECREASE DEFECT DENSITY IN MOLECULAR-BEAM EPITAXIAL SILICON FILMS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (04): : L227 - L229