VIOLET LIGHT-EMITTING SRS/SRCL-EU THIN-FILM ELECTROLUMINESCENT DEVICES

被引:4
作者
KONG, W
AHMED, S
FERGUSON, J
SOLANKI, R
机构
[1] Department of Electrical Engineering and Applied Physics, Oregon Graduate Institute, Portland, OR 97291-1000
关键词
D O I
10.1063/1.115514
中图分类号
O59 [应用物理学];
学科分类号
摘要
Emission of bright (over 9 cd/m2) violet light centered at 404 nm has been achieved from SrS:Eu thin-film electroluminescent (EL) devices. The brightness has remained stable after several hours of operation. The source of this light is believed to be the 5d-4f transition of Eu2+ in the SrCl2 host, which is formed near the ZnS/SrS interfaces within the sandwich structure of the EL devices. Similar device structures were also utilized to produce ultraviolet EL emission at 367 nm from SrCl 2:Ce3+ layers. These devices were grown via atomic layer epitaxy. © 1995 American Institute of Physics.
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页码:7 / 9
页数:3
相关论文
共 15 条
[1]  
ANTONYAK OT, 1987, OPT SPEKTROSK+, V63, P529
[2]   EU+2 FLUORESCENCE IN BACL2 [J].
BRIXNER, LH ;
FERRETTI, A .
JOURNAL OF SOLID STATE CHEMISTRY, 1976, 18 (02) :111-116
[3]  
Caldino U. G., 1989, Crystal Lattice Defects and Amorphous Materials, V18, P511
[4]   THE ABSORPTION AND FLUORESCENCE SPECTRA OF BIVALENT EUROPIUM ION IN CRYSTALS [J].
FREED, S ;
KATCOFF, S .
PHYSICA, 1948, 14 (01) :17-28
[5]  
GOLDLEWSKI M, 1993, MATER RES SOC S P, V301, P275
[6]  
HUETTLE B, 1992, 6TH P INT WORKSH EL, P123
[7]   FLUORESCENCE LIFETIME AND QUANTUM EFFICIENCY FOR 5D-]4F TRANSITIONS IN EU2+ DOPED CHLORIDE AND FLUORIDE-CRYSTALS [J].
KOBAYASI, T ;
MROCZKOWSKI, S ;
OWEN, JF ;
BRIXNER, LH .
JOURNAL OF LUMINESCENCE, 1980, 21 (03) :247-257
[8]   ATOMIC LAYER EPITAXY OF ZNS-TB THIN-FILM ELECTROLUMINESCENT DEVICES [J].
KONG, W ;
FOGARTY, J ;
SOLANKI, R .
APPLIED PHYSICS LETTERS, 1994, 65 (06) :670-672
[9]   EXCITED-STATE ABSORPTION OF EU-2+-DOPED MATERIALS [J].
LAWSON, JK ;
PAYNE, SA .
PHYSICAL REVIEW B, 1993, 47 (21) :14003-14010
[10]   THE GROWTH AND CHARACTERIZATION OF THE ACTIVE LAYERS IN ELECTROLUMINESCENT DISPLAY DEVICES [J].
LI, JW ;
LIN, YJ ;
SU, YK ;
WU, TS ;
YOKOYAMA, M .
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1992, 25 (1-2) :103-129