1/F-GAMMA NOISE IN THICK-FILM RESISTORS AS AN EFFECT OF TUNNEL AND THERMALLY ACTIVATED EMISSIONS, FROM MEASURES VERSUS FREQUENCY AND TEMPERATURE

被引:47
作者
PELLEGRINI, B [1 ]
SALETTI, R [1 ]
TERRENI, P [1 ]
PRUDENZIATI, M [1 ]
机构
[1] UNIV MODENA,IST FIS,I-41100 MODENA,ITALY
来源
PHYSICAL REVIEW B | 1983年 / 27卷 / 02期
关键词
D O I
10.1103/PhysRevB.27.1233
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1233 / 1243
页数:11
相关论文
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