SINGLE EVENT ERROR IMMUNE CMOS RAM

被引：45

作者：

ANDREWS, JL

SCHROEDER, JE

GINGERICH, BL

KOLASINSKI, WA

KOGA, R

DIEHL, SE

机构：

[1] N CAROLINA STATE UNIV, RALEIGH, NC 27607 USA

[2] HARRIS SEMICOND CO, MELBOURNE, FL USA

[3] AEROSP CORP, LOS ANGELES, CA USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1982年 / 29卷 / 06期

关键词：

D O I：

10.1109/TNS.1982.4336492

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2040 / 2043

页数：4

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