CURRENT TRANSPORT PHENOMENA IN SIO2-FILMS

被引:3
作者
RAI, BP [1 ]
SINGH, K [1 ]
SRIVASTAVA, RS [1 ]
机构
[1] BANARAS HINDU UNIV, DEPT PHYS, VARANASI 221005, INDIA
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1976年 / 36卷 / 02期
关键词
D O I
10.1002/pssa.2210360219
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:591 / 595
页数:5
相关论文
共 14 条
[1]   ELECTRONIC CONDUCTION IN THERMALLY GROWN SILICON DIOXIDE FILMS [J].
BRANDER, RW ;
LAMB, DR ;
RUNDLE, PC .
BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (01) :23-&
[2]   SURFACE STATES IN SILICON FROM CHARGES IN OXIDE COATING [J].
GOETZBERGER, A ;
HEINE, V ;
NICOLLIAN, EH .
APPLIED PHYSICS LETTERS, 1968, 12 (03) :95-+
[3]  
Hill RM., 1967, THIN SOLID FILMS, V1, P39, DOI [10.1016/0040-6090(67)90019-3, DOI 10.1016/0040-6090(67)90019-3]
[4]   SPACE-CHARGE-LIMITED IONIC CURRENTS IN SILICON DIOXIDE FILMS [J].
HOFSTEIN, SR .
APPLIED PHYSICS LETTERS, 1967, 10 (10) :291-+
[5]  
Jonscher A. K., 1967, THIN SOLID FILMS, V1, P213
[6]   A NON-FILAMENTARY SWITCHING ACTION IN THERMALLY GROWN SILICON DIOXIDE FILMS [J].
LAMB, DR ;
RUNDLE, PC .
BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (01) :29-&
[7]  
LAMB DR, 1967, ELECTRICAL CONDUCTIO
[8]  
LENZLINGER M, 1972, J APPL PHYS, V40, P603
[9]   ELECTRICAL-CONDUCTION AND DIELECTRIC BREAKDOWN IN SILICON DIOXIDE FILMS ON SILICON [J].
OSBURN, CM ;
WEITZMAN, EJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1972, 119 (05) :603-+
[10]   NONCRYSTALLINE STRUCTURE AND ELECTRONIC CONDUCTION OF SILICON DIOXIDE FILMS [J].
REVESZ, AG .
PHYSICA STATUS SOLIDI, 1967, 24 (01) :115-+