DYNAMIC PICOSECOND STUDIES OF OPTICALLY-EXCITED SILICON

被引：1

作者：

BOYD, IW ^{[1
]}

BOGGESS, TF ^{[1
]}

SMIRL, AL ^{[1
]}

MOSS, SC ^{[1
]}

机构：

[1] N TEXAS STATE UNIV,CTR APPL QUANTUM ELECTR,DENTON,TX 76203

来源：

OPTICA ACTA | 1986年 / 33卷 / 04期

关键词：

D O I：

10.1080/713821949

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：527 / 534

页数：8

共 15 条

[1] SIMULTANEOUS MEASUREMENT OF THE 2-PHOTON COEFFICIENT AND FREE-CARRIER CROSS-SECTION ABOVE THE BANDGAP OF CRYSTALLINE SILICON [J].

BOGGESS, TF ;

BOHNERT, KM ;

MANSOUR, K ;

MOSS, SC ;

BOYD, IW ;

SMIRL, AL .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1986, 22 (02) :360-368

[2]

Boyd I. W., 1984, Energy Beam-Solid Interactions and Transient Thermal Processing Symposium, P203

[3] VARIOUS PHASE-TRANSITIONS AND CHANGES IN SURFACE-MORPHOLOGY OF CRYSTALLINE SILICON INDUCED BY 4-260-PS PULSES OF 1-MU-M RADIATION [J].

BOYD, IW ;

MOSS, SC ;

BOGGESS, TF ;

SMIRL, AL .

APPLIED PHYSICS LETTERS, 1984, 45 (01) :80-82

[4]

BOYD IW, 1985, APPL PHYS LETT, V46, P368

[5]

Bucksbaum P. H., 1984, Energy Beam-Solid Interactions and Transient Thermal Processing Symposium, P93

[6] FEMTOSECOND IMAGING OF MELTING AND EVAPORATION AT A PHOTOEXCITED SILICON SURFACE [J].

DOWNER, MC ;

FORK, RL ;

SHANK, CV .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1985, 2 (04) :595-599

[7]

Gamo K., 1981, Laser and Electron-Beam Solid Interactions and Materials Processing. Proceedings of the Materials Research Society Symposium, P97

[8] PICOSECOND DYNAMICS OF PULSED LASER ANNEALING OF ION-IMPLANTED SILICON [J].

KANEMITSU, Y ;

KURODA, H ;

SHIONOYA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1984, 23 (05) :618-621

[9]

Lietoila A., 1981, Laser and Electron-Beam Solid Interactions and Materials Processing. Proceedings of the Materials Research Society Symposium, P23

[10]

Liu J. M., 1983, Laser-Solid Interactions and Transient Thermal Processing of Materials, P3

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