IMAGING PROPERTIES AND APPLICATIONS OF SLOW-SCAN CHARGE-COUPLED-DEVICE CAMERAS SUITABLE FOR ELECTRON-MICROSCOPY

Basic operation and important imaging characteristics of slow-scan charge-coupled device (CCD) cameras suitable for electron microscopy are reviewed. It is shown that these image detectors approach single electron detection, have high dynamic range, exceptional linearity, negligible geometric distortion and excellent spectral transfer characteristics. A number of example applications illustrate the impact of slow-scan CCD cameras on quantitative image analysis, advanced multiple-image reconstruction methods and automated data collection.