STRUCTURE OF THE AU/SI(111) SURFACE BY SCANNING TUNNELING MICROSCOPY

被引：6

作者：

DUMAS, P

HUMBERT, A

MATHIEU, G

MATHIEZ, P

MOUTTET, C

ROLLAND, R

SALVAN, F

THIBAUDAU, F

TOSCH, S

机构：

来源：

PHYSICA SCRIPTA | 1988年 / 38卷 / 02期

关键词：

D O I：

10.1088/0031-8949/38/2/026

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：244 / 245

页数：2

共 8 条

[1] ENERGY-DEPENDENT STATE-DENSITY CORRUGATION OF A GRAPHITE SURFACE AS SEEN BY SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

FUCHS, H ;

GERBER, C ;

ROHRER, H ;

STOLL, E ;

TOSATTI, E .

EUROPHYSICS LETTERS, 1986, 1 (01) :31-36

[2] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE [J].

GERBER, C ;

BINNIG, G ;

FUCHS, H ;

MARTI, O ;

ROHRER, H .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) :221-224

[3] STRUCTURAL DISORDER OF SI(111) SQUARE ROOT 3X SQUARE ROOT 3-AU SURFACE STUDIED BY LEED [J].

HIGASHIYAMA, K ;

KONO, S ;

SAGAWA, T .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (02) :L117-L120

[4] PHYSICS AND ELECTRONICS OF THE NOBLE-METAL ELEMENTAL-SEMICONDUCTOR INTERFACE FORMATION - A STATUS-REPORT [J].

LELAY, G .

SURFACE SCIENCE, 1983, 132 (1-3) :169-204

[5] REAL-SPACE DETERMINATION OF ATOMIC-STRUCTURE OF THE SI(111)-SQUARE-ROOT-3 X SQUARE-ROOT-3 R 30-DEGREES-AU SURFACE BY LOW-ENERGY ALKALI-ION SCATTERING [J].

OURA, K ;

KATAYAMA, M ;

SHOJI, F ;

HANAWA, T .

PHYSICAL REVIEW LETTERS, 1985, 55 (14) :1486-1489

[6] AU/SI(111) OVERLAYER - CHARACTERIZATION BY TUNNELING MICROSCOPY AND SPECTROSCOPY [J].

SALVAN, F ;

FUCHS, H ;

BARATOFF, A ;

BINNIG, G .

SURFACE SCIENCE, 1985, 162 (1-3) :634-639

[7] LOCAL ELECTRON-STATES AND SURFACE GEOMETRY OF SI(111)-(SQUARE-ROOT 3 X SQUARE-ROOT 3)AG [J].

VANLOENEN, EJ ;

DEMUTH, JE ;

TROMP, RM ;

HAMERS, RJ .

PHYSICAL REVIEW LETTERS, 1987, 58 (04) :373-376

[8] STRUCTURE OF THE AG/SI(111) SURFACE BY SCANNING TUNNELING MICROSCOPY [J].

WILSON, RJ ;

CHIANG, S .

PHYSICAL REVIEW LETTERS, 1987, 58 (04) :369-372

← 1 →