CHANNELING ANALYSIS OF STRAIN IN SUPERLATTICES

被引：67

作者：

PICRAUX, ST

CHU, WK

ALLEN, WR

ELLISON, JA

机构：

[1] UNIV N CAROLINA, CHAPEL HILL, NC 27514 USA

[2] UNIV NEW MEXICO, ALBUQUERQUE, NM 87131 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1986年 / 15卷 / 1-6期

关键词：

D O I：

10.1016/0168-583X(86)90309-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：306 / 313

页数：8

共 23 条

[1] ION DECHANNELING DUE TO LATTICE STRAINS IN SEMICONDUCTOR SUPER-LATTICES [J].

BARRETT, JH .

PHYSICAL REVIEW B, 1983, 28 (05) :2328-2334

[2] MECHANISM OF ION DECHANNELING IN COMPOUND SEMICONDUCTOR SUPER-LATTICES [J].

BARRETT, JH .

APPLIED PHYSICS LETTERS, 1982, 40 (06) :482-484

[3] GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE GROWN BY MOLECULAR-BEAM EPITAXY [J].

BEAN, JC ;

FELDMAN, LC ;

FIORY, AT ;

NAKAHARA, S ;

ROBINSON, IK .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02) :436-440

[4] RESONANCE BETWEEN THE WAVELENGTH OF PLANAR-CHANNELED PARTICLES AND THE PERIOD OF STRAINED-LAYER SUPERLATTICES [J].

CHU, WK ;

ELLISON, JA ;

PICRAUX, ST ;

BIEFELD, RM ;

OSBOURN, GC .

PHYSICAL REVIEW LETTERS, 1984, 52 (02) :125-128

[5] ION-BEAM CRYSTALLOGRAPHY OF INAS-GASB SUPER-LATTICES [J].

CHU, WK ;

SARIS, FW ;

CHANG, CA ;

LUDEKE, R ;

ESAKI, L .

PHYSICAL REVIEW B, 1982, 26 (04) :1999-2010

[6] PLANAR DECHANNELING STUDIES OF STRAINED-LAYER SUPERLATTICE STRUCTURES [J].

CHU, WK ;

ELLISON, JA ;

PICRAUX, ST ;

BIEFELD, RM ;

OSBOURN, GC .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :81-89

[7] SUPER-LATTICE INTERFACE AND LATTICE STRAIN-MEASUREMENT BY ION CHANNELING [J].

CHU, WK ;

PAN, CK ;

CHANG, CA .

PHYSICAL REVIEW B, 1983, 28 (07) :4033-4036

[8] COMMENSURATE AND INCOMMENSURATE STRUCTURES IN MOLECULAR-BEAM EPITAXIALLY GROWN GEXSI1-X FILMS ON SI(100) [J].

FIORY, AT ;

BEAN, JC ;

FELDMAN, LC ;

ROBINSON, IK .

JOURNAL OF APPLIED PHYSICS, 1984, 56 (04) :1227-1229

[9] ELASTIC RELAXATION IN TRANSMISSION ELECTRON-MICROSCOPY OF STRAINED-LAYER SUPERLATTICES [J].

GIBSON, JM ;

HULL, R ;

BEAN, JC ;

TREACY, MMJ .

APPLIED PHYSICS LETTERS, 1985, 46 (07) :649-651

[10] ANALYSES OF METALORGANIC CHEMICAL-VAPOR-DEPOSITION-GROWN ALXGA1-XAS GAAS STRAINED SUPERLATTICE STRUCTURES BY BACKSCATTERING SPECTROMETRY AND X-RAY ROCKING CURVES [J].

HAMDI, AH ;

SPERIOSU, VS ;

NICOLET, MA ;

TANDON, JL ;

YEH, YCM .

JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) :1400-1402

← 1 2 3 →