THE FORMATION OF PLANE-WAVE X-RAY IMAGES OF MICRODEFECTS

被引：31

作者：

INDENBOM, VL

KAGANER, VM

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1985年 / 87卷 / 01期

关键词：

D O I：

10.1002/pssa.2210870125

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：253 / 265

页数：13

共 9 条

CHIKAWA, JI ;

ASAEDA, Y ;

FUJIMOTO, I .

[2]

CROUPA F, 1963, CZESCHOSL J PHYS A, V13, P301

[3]

INDENBOM VL, 1971, USPEKHI FIZ NAUK, V107, P229

[4]

INDENBOM VL, 1959, DOKL AKAD NAUK SSSR, V128, P806

[5] MICRODEFECTS IN SILICON DIFFERENT FROM SWIRLS [J].

KOHLER, R ;

MOHLING, W ;

PASEMANN, M .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 53 (02) :509-517

[6] SENSITIVITY OF PLANE-WAVE TOPOGRAPHY TO MICRODEFECTS [J].

KOHLER, R ;

MOHLING, W .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 78 (02) :489-496

RENNINGER, M .

RENNINGER, M .

[9]

Wilkens M., 1978, Diffraction and imaging techniques in material science, vol.1. Electron microscopy, 2nd revised edition, P185