CORRECTION FACTOR FOR RESISTIVITY AND HALL-MOBILITY MEASUREMENT OF 2-LAYER STRUCTURES BY SPREADING RESISTANCE TECHNIQUES

被引：8

作者：

GUTAI, L ^{[1
]}

VICSEK, T ^{[1
]}

机构：

[1] HUNGARIAN ACAD SCI,RES INST TECH PHYS,UJPEST 1 PF 76,BUDAPEST,HUNGARY

来源：

SOLID-STATE ELECTRONICS | 1975年 / 18卷 / 01期

关键词：

D O I：

10.1016/0038-1101(75)90075-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：93 / 97

页数：5

相关论文

共 11 条

[1] RESISTANCE OF INFINITE SLAB WITH DISK ELECTRODE
FOXHALL, GF
LEWIS, JA
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1964, 43 (4P2): : 1609 - +
[2] DETERMINATION OF GALVANOMAGNETIC COEFFICIENTS BY A ONE-POINT METHOD
GUTAI, L
[J]. SOLID-STATE ELECTRONICS, 1973, 16 (03) : 395 - 406
[3] CALCULATION OF SPREADING RESISTANCE CORRECTION FACTORS
HU, SM
[J]. SOLID-STATE ELECTRONICS, 1972, 15 (07) : 809 - &
[4] GEOMETRICAL MAGNETORESISTANCE AND HALL MOBILITY IN GUNN EFFECT DEVICES
JERVIS, TR
JOHNSON, EF
[J]. SOLID-STATE ELECTRONICS, 1970, 13 (02) : 181 - &
[5] SCHNABEL P, 1967, Z ANGEW PHYSIK, V22, P136
[6] APPLICATION OF MULTILAYER POTENTIAL DISTRIBUTION TO SPREADING RESISTANCE CORRECTION FACTORS
SCHUMANN, PA
GARDNER, EE
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (01) : 87 - &
[7] SPREADING RESISTANCE CORRECTION FACTORS
SCHUMANN, PA
GARDNER, EE
[J]. SOLID-STATE ELECTRONICS, 1969, 12 (05) : 371 - &
[8] MEASUREMENT OF RESISTIVITY OF SILICON BY SPREADING RESISTANCE METHOD
SEVERIN, PJ
[J]. SOLID-STATE ELECTRONICS, 1971, 14 (03) : 247 - &
[9] SNEDDON IN, 1966, MIXED BOUNDARY VALUE, P110
[10] THE POTENTIALS OF INFINITE SYSTEMS OF SOURCES AND NUMERICAL SOLUTIONS OF PROBLEMS IN SEMICONDUCTOR ENGINEERING
UHLIR, A
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1955, 34 (01): : 105 - 128