GRAPHICAL ANALYSIS OF ACCELERATED LIFE TEST DATA WITH A MIX OF FAILURE MODES

被引：9

作者：

NELSON, W ^{[1
]}

机构：

[1] GE,CORP RES & DEV,SCHENECTADY,NY 12345

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1975年 / 24卷 / 04期

关键词：

D O I：

10.1109/TR.1975.5215178

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：230 / 237

页数：8

共 23 条

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[5] ANALYSIS OF ACCELERATED LIFE TEST DATA .1. ARRHENIUS MODEL AND GRAPHICAL METHODS [J].

NELSON, W .

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[6] THEORY AND APPLICATIONS OF HAZARD PLOTTING FOR CENSORED FAILURE DATA [J].

NELSON, W .

TECHNOMETRICS, 1972, 14 (04) :945-&

[7] ANALYSIS OF ACCELERATED LIFE TEST DATA .3. PRODUCT COMPARISONS AND CHECKS ON VALIDITY OF MODEL AND DATA [J].

NELSON, W .

IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1972, EI 7 (02) :99-&

[8] SURVEY OF METHODS FOR PLANNING AND ANALYZING ACCELERATED TESTS [J].

NELSON, W .

IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1974, EL 9 (01) :12-18

[9] ANALYSIS OF ACCELERATED LIFE TEST DATA .2. NUMERICAL METHODS AND TEST PLANNING [J].

NELSON, W .

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[10]

Nelson W., 1970, J QUAL TECHNOL, V2, P126

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