LAYERED SYNTHETIC MICROSTRUCTURES FOR LONG WAVELENGTH X-RAY SPECTROMETRY

被引：19

作者：

NICOLOSI, JA ^{[1
]}

GROVEN, JP ^{[1
]}

MERLO, D ^{[1
]}

JENKINS, R ^{[1
]}

机构：

[1] JCPDS INT CTR DIFFRACT DATA, SWARTHMORE, PA 19081 USA

来源：

OPTICAL ENGINEERING | 1986年 / 25卷 / 08期

关键词：

ACID PHTHALATE - LAYERED SYNTHETIC MICROSTRUCTURES - LONG WAVELENGTH - SPECTROCHEMICAL ANALYSIS - X-RAY MULTILAYERED OPTICS;

D O I：

10.1117/12.949690

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

(Edited Abstract)

引用

页码：964 / 969

页数：6

共 29 条

[1]

Barbee Jr. T.W., 1981, AIP C P, V75, P131

[2]

BARBEE TW, 1976, 26TH NSF ANN REP

[3]

Barbee TW, 1985, P SPIE, V563, P2, DOI [10.1117/12.949647, DOI 10.1117/12.949647]

[4]

BERTIN EP, 1975, PRINCIPLES PRACTICE, P89

[5] Films built by depositing successive monomolecular layers on a solid surface [J].

Blodgett, KB .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1935, 57 (01) :1007-1022

[6] X-RAY DIFFRACTION AND DIFFUSION IN METAL FILM LAYERED STRUCTURES [J].

DINKLAGE, J ;

FRERICHS, R .

JOURNAL OF APPLIED PHYSICS, 1963, 34 (09) :2633-&

[7] An X-ray method of determining rates of diffusion in the solid state [J].

DuMond, J ;

Youtz, JP .

JOURNAL OF APPLIED PHYSICS, 1940, 11 (05) :357-365

[8]

EHLERT RC, 1967, ADV XRAY ANAL, V10, P389

[9] LAYERED SYNTHETIC MICROSTRUCTURES AS DISPERSING DEVICES IN X-RAY SPECTROMETERS [J].

GILFRICH, JV ;

NAGEL, DJ ;

BARBEE, TW .

APPLIED SPECTROSCOPY, 1982, 36 (01) :58-61

[10]

GILFRICH JV, 1982, ADV X RAY ANAL, V25, P355

← 1 2 3 →