CHANNELING AND OPTICAL STUDY OF THIN SI CRYSTALS DISTORTED BY PRESSURE

被引：3

作者：

ALEXANDER, RB ^{[1
]}

DRALLOS, PJ ^{[1
]}

JOHNSON, SC ^{[1
]}

PADMANABHAN, KR ^{[1
]}

BUCHHOLZ, JC ^{[1
]}

机构：

[1] GM CORP,RES LABS,DEPT PHYS,WARREN,MI 48090

来源：

PHYSICAL REVIEW B | 1983年 / 28卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.28.1207

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1207 / 1213

页数：7

共 11 条

[1] EFFECT OF PRESSURE DIFFERENTIAL ON CHANNELING IN THIN SI CRYSTALS [J].

ALEXANDER, RB ;

JOHNSON, SC ;

PADMANABHAN, KR ;

BUCHHOLZ, JC .

APPLIED PHYSICS LETTERS, 1983, 42 (09) :804-806

[2] WAVES AND THOMS THEOREM [J].

BERRY, MV .

ADVANCES IN PHYSICS, 1976, 25 (01) :1-26

[3] CUSPED RAINBOWS AND INCOHERENCE EFFECTS IN RIPPLING-MIRROR MODEL FOR PARTICLE SCATTERING FROM SURFACES [J].

BERRY, MV .

JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 1975, 8 (04) :566-+

[4] PREPARATION OF LARGE-AREA MONO-CRYSTALLINE SILICON THIN WINDOWS [J].

CHEUNG, NW .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (09) :1212-1216

[5] GEOMETRICAL MODEL OF NEAR-FIELD INTERFERENCE PRODUCED BY WAVE-FRONT DISTORTION [J].

DRALLOS, PJ ;

ALEXANDER, RB .

APPLIED OPTICS, 1983, 22 (11) :1613-1614

[6] SEPARATE ESTIMATE OF CRYSTALLITE ORIENTATIONS AND SCATTERING CENTERS IN POLYCRYSTALS BY BACKSCATTERING TECHNIQUE [J].

ISHIWARA, H ;

FURUKAWA, S .

JOURNAL OF APPLIED PHYSICS, 1976, 47 (04) :1686-1689

[7]

LEE KW, 1982, IEEE T ELECTRON DEV, V29, P34

[8]

LINDHARD J, 1965, K DAN VIDENSK SELSK, V34

[9] SILICON AS A MECHANICAL MATERIAL [J].

PETERSEN, KE .

PROCEEDINGS OF THE IEEE, 1982, 70 (05) :420-457

[10]

SIGURD D, 1973, THIN SOLID FILMS, V19, P319, DOI 10.1016/0040-6090(73)90068-0

← 1 2 →