RHEED STUDY OF THE KINETICS OF THE (2X1)-TO-(7X7) TRANSFORMATION IN CLEAVED SI(111)

被引：14

作者：

GARNI, B

SAVAGE, DE

LAGALLY, MG

机构：

来源：

SURFACE SCIENCE | 1990年 / 235卷 / 2-3期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0039-6028(90)90781-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The transformation of the (2 × 1) structure of cleaved Si(111) to the (7 × 7) structure with thermal annealing has been investigated with reflection high-energy electron diffraction (RHEED). An intermediate (5 × 5) phase is observed, making the reaction sequence (2 × 1) → (5 × 5) → (7 × 7). Initial results of the transformation kinetics show that the decay of the total area of the (2 × 1) phase follows a power law with an exponent x ≈ -1 2. © 1990.

引用

页码：L324 / L328

页数：5

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