APPLICATION OF THE BRAGG-PROFILING TECHNIQUE TO THE ANALYSIS OF METALLURGICAL AND OPTICAL-SURFACE LAYERS

被引：4

作者：

EICHINGER, P

QIONG, L

LEUTENECKER, R

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91027-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：489 / 492

页数：4

共 7 条

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[2]

Chu WK., 1978, BACKSCATTERING SPECT

PADUSCHEK, P ;

EICHINGER, P .

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[4]

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ROTH, J ;

BEHRISCH, R ;

SCHERZER, BM .

[6] EMPIRICAL CORRECTIONS TO ENERGY-LOSS OF HE-4 IONS IN OXIDES [J].

ZIEGLER, JF ;

CHU, WK ;

FENG, JSY .

[7]

ZIEGLER JF, 1974, ATOM DATA NUCL DATA, V13, P483