DETERMINATION OF PHOSPHORUS IN SEMICONDUCTOR GRADE SILICON BY NEUTRON-ACTIVATION ANALYSIS

被引：9

作者：

JASKOLSKA, H ^{[1
]}

ROWINSKA, L ^{[1
]}

机构：

[1] CTR ZERAN DEPT 20,INST NUCL RES,WARSAW,POLAND

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1975年 / 26卷 / 01期

关键词：

D O I：

10.1007/BF02516510

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：31 / 37

页数：7

共 34 条

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