共 9 条
- [1] CELOTTA RJ, 1982, MICROBEAM ANAL, P4212
- [3] DiStefano T. H., 1978, IBM Technical Disclosure Bulletin, V20, P4212
- [5] MAGNETIC-STRUCTURE ANALYSIS IN SCANNING ELECTRON-BEAM DEVICES BY MEANS OF THE LEED SPIN-POLARIZATION DETECTOR [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 36 (03): : 121 - 123
- [6] SPIN-POLARIZED SCANNING ELECTRON-MICROSCOPE FOR MAGNETIC DOMAIN OBSERVATION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (07): : L542 - L544
- [7] DOMAIN OBSERVATION WITH SPIN-POLARIZED SECONDARY ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (08) : 4244 - 4248