EVIDENCE FOR 2 ENERGY-LEVELS ASSOCIATED WITH EL2 TRAP IN GAAS

被引:26
作者
WOSINSKI, T
机构
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1985年 / 36卷 / 04期
关键词
D O I
10.1007/BF00616555
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:213 / 216
页数:4
相关论文
共 20 条
[11]   TECHNOLOGICAL AND PHYSICAL ASPECTS OF THE MAIN EL2 DEFECT IN GAAS [J].
KAMINSKA, M ;
SKOWRONSKI, M ;
KUSZKO, W ;
LAGOWSKI, J ;
PARSEY, J ;
GATOS, HC .
CZECHOSLOVAK JOURNAL OF PHYSICS, 1984, 34 (05) :409-414
[12]   ORIGIN OF THE 0.82-EV ELECTRON TRAP IN GAAS AND ITS ANNIHILATION BY SHALLOW DONORS [J].
LAGOWSKI, J ;
GATOS, HC ;
PARSEY, JM ;
WADA, K ;
KAMINSKA, M ;
WALUKIEWICZ, W .
APPLIED PHYSICS LETTERS, 1982, 40 (04) :342-344
[13]  
LANG DV, 1979, TOP APPL PHYS, V37, pCH3
[14]   COMPENSATION MECHANISMS IN GAAS [J].
MARTIN, GM ;
FARGES, JP ;
JACOB, G ;
HALLAIS, JP ;
POIBLAUD, G .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (05) :2840-2852
[15]  
MASTEROV VF, 1978, SOV PHYS SEMICOND+, V12, P363
[16]   PHOTOELECTRIC MEMORY EFFECT IN GAAS [J].
VINCENT, G ;
BOIS, D ;
CHANTRE, A .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (05) :3643-3649
[17]   IDENTIFICATION OF ASGA ANTISITES IN PLASTICALLY DEFORMED GAAS [J].
WEBER, ER ;
ENNEN, H ;
KAUFMANN, U ;
WINDSCHEIF, J ;
SCHNEIDER, J ;
WOSINSKI, T .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (09) :6140-6143
[18]  
WOSINSKI T, 1981, CRYST RES TECHNOL, V16, P217
[19]   ARSENIC ANTISITE DEFECTS AS THE MAIN ELECTRON TRAPS IN PLASTICALLY DEFORMED GAAS [J].
WOSINSKI, T ;
MORAWSKI, A ;
FIGIELSKI, T .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1983, 30 (04) :233-235
[20]  
WOSINSKI T, 1984, UNPUB NOV C PHYS TEC