MEASURED CRITICAL RESOLVED SHEAR-STRESS AND CALCULATED TEMPERATURE AND STRESS-FIELDS DURING GROWTH OF CDZNTE

被引：54

作者：

PARFENIUK, C

WEINBERG, F

SAMARASEKERA, IV

SCHVEZOV, C

LI, L

机构：

[1] Department of Metals and Materials Engineering, The University of British Columbia, Vancouver

来源：

JOURNAL OF CRYSTAL GROWTH | 1992年 / 119卷 / 3-4期

关键词：

D O I：

10.1016/0022-0248(92)90678-C

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The critical resolved shear stress (CRSS) of Cd0.46Zn0.04Te0.50 was measured at elevated temperatures. The temperature and stress fields for the vertical Bridgman growth of CdZnTe were calculated using the finite element method. The measured CRSS and the calculated shear stress are related to dislocation formation in the crystal, during growth.

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页码：261 / 270

页数：10

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