SCANNING ELECTROCHEMICAL MICROSCOPY - HIGH-RESOLUTION DEPOSITION AND ETCHING OF METALS

[1] SURFACE MODIFICATION WITH THE SCANNING TUNNELING MICROSCOPE [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 492 - 499

[2] LINEAR SWEEP VOLTAMMETRY AT VERY SMALL STATIONARY DISK ELECTRODES [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1984, 171 (1-2): : 219 - 230

[3] SCANNING ELECTROCHEMICAL MICROSCOPY - INTRODUCTION AND PRINCIPLES [J]. ANALYTICAL CHEMISTRY, 1989, 61 (02) : 132 - 138

[4] ATOMIC-SCALE SURFACE MODIFICATIONS USING A TUNNELING MICROSCOPE [J]. NATURE, 1987, 325 (6103) : 419 - 421

[5] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123

[6] BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[7] COMPLEX-FORMATION AND IONIC-CONDUCTIVITY OF POLYPHOSPHAZENE SOLID ELECTROLYTES [J]. SOLID STATE IONICS, 1986, 18-9 (pt 1) : 258 - 264

[8] BLONSKY PM, 1984, J AM CHEM SOC, V106, P6854, DOI 10.1021/ja00334a071

[9] HIGH-RESOLUTION DEPOSITION OF SILVER IN NAFION FILMS WITH THE SCANNING TUNNELING MICROSCOPE [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (03) : 785 - 786

[10] FABRICATION AND CHARACTERIZATION OF MICROTIPS FOR INSITU SCANNING TUNNELING MICROSCOPY [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1989, 261 (2B): : 477 - 482

[1] SURFACE MODIFICATION WITH THE SCANNING TUNNELING MICROSCOPE [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 492 - 499

[2] LINEAR SWEEP VOLTAMMETRY AT VERY SMALL STATIONARY DISK ELECTRODES [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1984, 171 (1-2): : 219 - 230

[3] SCANNING ELECTROCHEMICAL MICROSCOPY - INTRODUCTION AND PRINCIPLES [J]. ANALYTICAL CHEMISTRY, 1989, 61 (02) : 132 - 138

[4] ATOMIC-SCALE SURFACE MODIFICATIONS USING A TUNNELING MICROSCOPE [J]. NATURE, 1987, 325 (6103) : 419 - 421

[5] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123

[6] BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[7] COMPLEX-FORMATION AND IONIC-CONDUCTIVITY OF POLYPHOSPHAZENE SOLID ELECTROLYTES [J]. SOLID STATE IONICS, 1986, 18-9 (pt 1) : 258 - 264

[8] BLONSKY PM, 1984, J AM CHEM SOC, V106, P6854, DOI 10.1021/ja00334a071

[9] HIGH-RESOLUTION DEPOSITION OF SILVER IN NAFION FILMS WITH THE SCANNING TUNNELING MICROSCOPE [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (03) : 785 - 786

[10] FABRICATION AND CHARACTERIZATION OF MICROTIPS FOR INSITU SCANNING TUNNELING MICROSCOPY [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1989, 261 (2B): : 477 - 482