HIGH-RESOLUTION DEPOSITION OF SILVER IN NAFION FILMS WITH THE SCANNING TUNNELING MICROSCOPE

被引：74

作者：

CRASTON, DH

LIN, CW

BARD, AJ

机构：

[1] Univ of Texas, Austin, TX, USA, Univ of Texas, Austin, TX, USA

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1988年 / 135卷 / 03期

关键词：

D O I：

10.1149/1.2095752

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：785 / 786

页数：2

共 10 条

[1] SURFACE MODIFICATION WITH THE SCANNING TUNNELING MICROSCOPE
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[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 492 - 499
[2] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE
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[J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123
[3] BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[4] HIGH-RESOLUTION PHOTOELECTROCHEMICAL ETCHING OF NORMAL-GAAS WITH THE SCANNING ELECTROCHEMICAL AND TUNNELING MICROSCOPE
LIN, CW
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[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (04) : 1038 - 1039
[5] LIU HY, 1986, J AM CHEM SOC, V108, P3839
[6] SCANNING TUNNELING MICROSCOPE AS A MICROMECHANICAL TOOL
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[J]. APPLIED PHYSICS LETTERS, 1987, 50 (10) : 569 - 570
[7] EXPOSURE OF CALCIUM-FLUORIDE RESIST WITH THE SCANNING TUNNELING MICROSCOPE
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (01): : 430 - 433
[8] NANOMETER LITHOGRAPHY WITH THE SCANNING TUNNELING MICROSCOPE
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[J]. APPLIED PHYSICS LETTERS, 1985, 46 (09) : 832 - 834
[9] DIRECT WRITING OF SUBMICRON METALLIC FEATURES WITH A SCANNING TUNNELING MICROSCOPE
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DELOZANNE, AL
[J]. APPLIED PHYSICS LETTERS, 1987, 51 (04) : 247 - 249
[10] NANOMETER SCALE STRUCTURE FABRICATION WITH THE SCANNING TUNNELING MICROSCOPE
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ENG, L
ROSENTHALER, L
HIDBER, HR
GUNTHERODT, HJ
GARCIA, N
[J]. APPLIED PHYSICS LETTERS, 1987, 51 (04) : 244 - 246

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