TRACE ANALYSIS OF HIGH-PURITY IRON BY TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY

被引：20

作者：

CHEN, JS

BERNDT, H

KLOCKENKAMPER, R

TOLG, G

机构：

[1] INST SPEKTROCHEM & ANGEW SPEKT,W-4600 DORTMUND 1,GERMANY

[2] MAX PLANCK INST MET RES,REINSTSTOFFANALYT LAB,W-4600 DORTMUND 1,GERMANY

来源：

FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1990年 / 338卷 / 08期

关键词：

D O I：

10.1007/BF00322026

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A combined procedure enabling simultaneous multielement analysis of trace impurities in high-purity iron is presented. After removal of the iron matrix by solvent extraction with methyl isobutyl ketone, the trace elements Ti, V, Cr, Mn, Ni, Cu, Pb and Bi are determined by means of total reflection X-ray fluorescence analysis. Detection limits are found in the range of 100 ng/g. The reliability of the method is verified by the analysis of commercial high-purity iron and by the comparison of analytical data obtained by ICP-AES.

引用

页码：891 / 894

页数：4

共 13 条

[1]

Bertin E. P., 1975, PRINCIPLES PRACTICE

[2] DETERMINATION OF TRACE-ELEMENTS IN HIGH-PURITY ALUMINUM BY TOTAL REFLECTION X-RAY-FLUORESCENCE AFTER THEIR SEPARATION ON CELLULOSE LOADED WITH HEXAMETHYLENEDITHIOCARBAMATES [J].

BURBA, P ;

WILLMER, PG ;

BECKER, M ;

KLOCKENKAMPER, R .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1989, 44 (05) :525-532

[3]

CHEN JS, 1990, IN PRESS

[4]

GILFRICH JV, 1989, PROG ANAL SPECTROSC, V12, P1

[5]

IUPAC. International Union of Pure and Applied Chemistry, 1978, SPECTROCHIM ACTA B, V33, P241, DOI [DOI 10.1016/0584-8547(78)80044-5, 10.1016/0584-8547(78)80044-5]

[6] X-RAY SPECTRAL-ANALYSIS - PRESENT STATUS AND TRENDS [J].