IMAGE CHARGES AND THEIR INFLUENCE ON THE GROWTH AND THE NATURE OF THIN OXIDE-FILMS

被引：57

作者：

STONEHAM, AM

TASKER, PW

机构：

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1987年 / 55卷 / 02期

关键词：

D O I：

10.1080/13642818708211206

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：237 / 252

页数：16

共 17 条

[1] [Anonymous], 1982, EXCITONS
[2] BLANC J, 1987, IN PRESS PHIL MAG B
[3] COLLOT P, 1985, PHILOS MAG B, V52, P1059
[4] GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
GROVE, AS
[J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) : 3770 - &
[5] OXIDATION OF SILICON - STRAIN AND LINEAR KINETICS
DOREMUS, RH
[J]. THIN SOLID FILMS, 1984, 122 (03) : 191 - 196
[6] VACANCY FORMATION ENERGIES NEAR THE SURFACE OF AN IONIC-CRYSTAL
DUFFY, DM
HOARE, JP
TASKER, PW
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (07): : L195 - L199
[7] FLYNN CP, 1972, DEFECTS DIFFUSION SO
[8] THERMIONIC EMISSION
HERRING, C
NICHOLS, MH
[J]. REVIEWS OF MODERN PHYSICS, 1949, 21 (02) : 185 - 270
[9] Landau L. D., 1960, ELECTRODYNAMICS CONT
[10] LIFETIME OF ELECTRONS, HOLES AND EXCITONS BEFORE SELF-TRAPPING
MOTT, NF
STONEHAM, AM
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (17): : 3391 - 3398