ELECTRON-ENERGY-LOSS X-RAY ABSORPTION-SPECTROSCOPY - A NONDESTRUCTIVE STRUCTURAL-DEPTH MICROPROBE

被引:6
作者
BEDZYK, MJ [1 ]
MATERLIK, G [1 ]
机构
[1] DESY,HAMBURGER SYNCHROTRONSTRAHLUNGSLAB,D-2000 HAMBURG 52,FED REP GER
来源
PHYSICAL REVIEW B | 1985年 / 32卷 / 06期
关键词
D O I
10.1103/PhysRevB.32.4228
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:4228 / 4231
页数:4
相关论文
共 15 条
[1]   DEPTH-SELECTIVE X-RAY STANDING-WAVE ANALYSIS [J].
BEDZYK, MJ ;
MATERLIK, G ;
KOVALCHUK, MV .
PHYSICAL REVIEW B, 1984, 30 (08) :4881-4884
[2]   STUDY OF VERY THIN SURFACE-LAYERS BY MEANS OF DEPTH SELECTIVE CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY (DCEMS) [J].
BELOZERSKII, GN ;
BOHM, C ;
EKDAHL, T ;
LILJEQUIST, D .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 192 (2-3) :539-543
[3]  
BIANCONI A, 1983, SPRINGER SERIES CHEM, V27
[4]   LOCAL-STRUCTURE OF ADSORBATES ON SEMICONDUCTOR SURFACES USING SEXAFS - A BRIEF SUMMARY [J].
CITRIN, PH ;
ROWE, JE .
SURFACE SCIENCE, 1983, 132 (1-3) :205-211
[5]   NEW METHOD OF MEASURING ELECTRON-EMISSION FROM MONOCRYSTALS UNDER X-RAY-DIFFRACTION CONDITIONS [J].
HERTEL, N ;
KOVALCHUK, MV ;
AFANASEV, AM ;
IMAMOV, RM .
PHYSICS LETTERS A, 1980, 75 (06) :501-502
[6]   ELECTRON-YIELD EXTENDED X-RAY ABSORPTION FINE-STRUCTURE WITH THE USE OF A GAS-FLOW ELECTRON DETECTOR [J].
KORDESCH, ME ;
HOFFMAN, RW .
PHYSICAL REVIEW B, 1984, 29 (01) :491-492
[7]  
KRILL G, 1982, VALENCE INSTABILITIE, P155
[8]   A FEEDBACK-CONTROL SYSTEM FOR SYNCHROTRON RADIATION DOUBLE CRYSTAL INSTRUMENTS [J].
KROLZIG, A ;
MATERLIK, G ;
SWARS, M ;
ZEGENHAGEN, J .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 219 (02) :430-434
[9]   EXPERIMENTAL ATOM-TO-SOLID L-LEVEL SHIFTS FOR CE, SM, GD, AND ER [J].
MATERLIK, G ;
SONNTAG, B ;
TAUSCH, M .
PHYSICAL REVIEW LETTERS, 1983, 51 (14) :1300-1303
[10]  
PARATT LG, 1957, PHYS REV, V105, P1228